ITU-T Liaison Statements

ITU-T LIAISON STATEMENT SG15-LS307

Outgoing from:

SG15

Sent for action to:

IEC TC 86 SC 86A

Sent for information to:

In response to:

Source:

ITU-T Study Group 15

Title:

LS on far field pattern scanning based mode-field diameter test method.

Reference:

Approval date:

2021-04-23

Deadline date:

2021-10-31

Full path:

See full conversation:

LS	Title	From	To	Approval date
IEC TC 86-LS2	LS/r on far field pattern scanning description from IEC SC 86A to ITU-T SG15 (reply to SG15-LS307)	IEC TC 86	SG15;	2021-10-25
SG15-LS307	LS on far field pattern scanning based mode-field diameter test method.	SG15	IEC TC 86 SC 86A;	2021-04-23