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ITU-T K.94 (05/2012)

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Mutual disturbance test method for evaluating performance degradation of converged terminal devices
With the rapid progress of the telecommunication terminal technology, more and more converged devices are appearing on the market. As the modules of the converged devices are so close together, if the printed circuit board (PCB) is not designed properly, without adequate earthing, shielding or filtering, an electromagnetic compatibility (EMC) disturbance can occur between the modules. Recommendation ITU-T K.94 analyses the EMC disturbance between different modules in converged terminal devices and defines a conducted test method. This mutual-disturbance test can be used as one of the immunity test items listed in Recommendation ITU-T K.34 and Recommendation ITU-T K.48 to determine the level of performance degradation.
Approval date: 2012-05-29
Provisional name:K.deg
Approval process:AAP
Status: In force
Maintenance responsibility: ITU-T Study Group 5
Further details: Patent statement(s)
Development history
Ed. ITU-T Recommendation Status Summary Table of Contents Download
1 K.94 (05/2012) In force