Information and communication technology (ICT) goods consist of many parts and modules, which are comprised of relatively small quantities of rare metals and large quantities of major materials (e.g. iron, nonferrous metals, plastics, glasses, and engineering ceramics). They are usually produced through complex production procedures. To achieve successful recycling systems, the rare metals information provided by manufacturers should be accurate. However, many measurement and characterization methods may be used to obtain information on rare metals for elements of ICT goods. Each method has its own intrinsic advantages and disadvantages in the analysis of the information of such elements. The element separation abilities and quantitative resolutions are different according to the measurement methods used and there are no standardized measurement methods to define the quantities and qualities of rare metals. However, IEC 62321 provides some guidelines for X-ray fluorescence (XRF) and inductively coupled plasma mass spectrometry (ICP-MS) measurement methods to perform qualitative and quantitative analysis of unknown samples and harmful materials. Based on the guidelines of IEC 62321, this Recommendation provides reference characterization procedures for efficient recycling of rare metals by using XRF and ICP-MS measurement methods.