Document :

ITU-T SG16  (Study Period 2005)  Contribution  474

Title :

Test conditions for EV-VBR optimization/characterization phase II

Date :

2008-04-15

Source :

LM Ericsson, Nokia

AI/Question :

Q9/16

Meeting :

2008-04-22

Access :

Restricted to TIES users [ITU-T]