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  Home : ITU-T : Publications : Recommendations : Z Series : Z.169
Recently posted -  Search Recommendations
   
Z.169 : Testing and Test Control Notation version 3: Using XML schema with TTCN-3  

Recommendation Z.169

In force components
Number
 Title Status
Z.169 (10/21)
  		Testing and Test Control Notation version 3: Using XML schema with TTCN-3   In force
 
 
Superseded and Withdrawn components
Number
 Title Status
Z.169 (11/08)
  		Testing and Test Control Notation version 3: TTCN-3 mapping from XML data definition   Superseded
Z.169 (03/11)
  		Testing and Test Control Notation version 3: TTCN-3 mapping from XML data definition   Superseded
Z.169 (05/12)
  		Testing and Test Control Notation version 3: TTCN-3 mapping from XML data definition   Superseded
Z.169 (07/13)
  		Testing and Test Control Notation version 3: Using XML schema with TTCN-3   Superseded
Z.169 (10/15)
  		Testing and Test Control Notation version 3: Using XML schema with TTCN-3   Superseded
Z.169 (10/16)
  		Testing and Test Control Notation version 3: Using XML schema with TTCN-3   Superseded
Z.169 (10/17)
  		Testing and Test Control Notation version 3: Using XML schema with TTCN-3   Superseded
Z.169 (10/18)
  		Testing and Test Control Notation version 3: Using XML schema with TTCN-3   Superseded
Z.169 (10/19)
  		Testing and Test Control Notation version 3: Using XML schema with TTCN-3   Superseded
Z.169 (10/20)
  		Testing and Test Control Notation version 3: Using XML schema with TTCN-3   Superseded

 

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