Document :

ITU-T SG 17  (Study Period 2017)  Temporary Document  2256-PLEN

Title :

Draft Revised Z.169, Testing and Test Control Notation version 3: Using XML schema with TTCN-3 (for consent)

Date :

2019-07-10

Source :

Rapporteur Q12/17

AI/Question :

Q12/17

Access :

Restricted to TIES users [ITU-T]