Document :

ITU-T SG04  (Study Period 2005)  Temporary Document  64-WP1

Title :

Addition of test patterns and modification of phase insertion method in Appendix VIII/O.172 (Revised COM4-C22)

Date :

2007-09-05

Source :

Rapporteur, Question 5/4

AI/Question :

Q5/4

Access :

Restricted to TIES users [ITU-T]