[806-GEN] LS/i/r evaluating the leakage and impact of radio frequency noise from telecommunication systems using metallic conductors (reply to ITU-R WP5B-5B/TEMP/399-E, ITU-R WP1A-1A/TEMP/103-E, ITU-R WP1A-1A/TEMP/101-E) [from ITU-T SG5]

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English	Zip (Document)	821401 bytes	2015-12-08	[806-GEN]

Document :	ITU-T SG 9 (Study Period 2013) Temporary Document 806-GEN
Title :	LS/i/r evaluating the leakage and impact of radio frequency noise from telecommunication systems using metallic conductors (reply to ITU-R WP5B-5B/TEMP/399-E, ITU-R WP1A-1A/TEMP/103-E, ITU-R WP1A-1A/TEMP/101-E) [from ITU-T SG5]
Date :	2015-12-08
Source :	ITU-T SG5
AI/Question :	Q13/9
Access :	Restricted to TIES users [ITU-T]