Title
Analytic models for bi-static scattering from a randomly rough surface with complex relative permittivity
Abstract
This study provides explicit mathematical formulations for the bi-static scattering coefficient from a randomly rough surface with a complex relative permittivity based on the following analytic models: Small perturbation model (SPM), Physical optics model (PO), and Kirchhoff approximation model (KA). Then it addresses the two shortcomings associated with each of the three models: i) limited applicability domain, and ii) null predicted values for the cross-polarized bi-static scattering coefficients within plane of incidence. The plane of incidence contains both backscattering direction and forward (specular reflection) direction which are of interest to the spectrum community.
Keywords
Bi-static scattering coefficient, height correlation length, height variance, mean square slope, reflection coefficient
Authors
Mostafa A. Karam
ASRC Federal Technical Services, McLean, Virginia, USA
Dr. Mostafa A. Karam received his B.Sc. and M. Sc. Degrees in electrical engineering from Cairo University, Giza, Egypt in 1977 and 1980 respectively. He received his Ph.D. degree in electrical engineering from the University of Kansas, Lawrence, KS in 1984. Since 2014, Dr. Karam is working as a senior principal spectrum management engineer at ASRC Federal Technical Service (ASTS). Before joining ASTS he worked at NASA Goddard Space Flight Center (1992 – 1993), Northrop Grumman Space Systems, Azusa CA (1993-2002), Northrop Grumman Navigation Systems, Woodland Hills, CA (2002-2011), and Odyssey Systems at Navy Marine Corp Spectrum Center, Fort Meade, MD (2011-2014). Dr. Karam contributed and served as a reviewer for several technical journals and conferences in the areas of electromagnetic wave propagation, radar, and remote sensing. He is the single author or the leading author of 12 patents in the areas of radars, digital communications, millimeter wave imaging, and improvised explosive devices (IED detection and identification.
Ryan S. McDonough
NASA Glenn Research Center, Cleveland, Ohio, USA
Ryan McDonough is an electronics engineer at NASA Glenn Research Center in Cleveland Ohio, USA. He is a member of the NASA Spectrum Analysis Center which is responsible for conducting technical studies for NASA Headquarters. He has worked regularly in ITU-R Study Group 3 (Radiowave Propagation) as head of U.S. delegation to ITU-R Working Party 3M. He also has worked in ITU-R Working Party 7B (Space Radiocommunication) as member of the U.S. Delegation and has conducted studies involving the radio spectrum needs of short duration satellite missions. Ryan has worked to produce several ITU-R contributions relating to Recommendations, Reports, and software products.
