ITU-T Rec. X.290 (11/1988) – OSI CONFORMANCE TESTING METHODOLOGY AND FRAMEWORK FOR PROTOCOL RECOMMENDATIONS FOR CCITT APPLICATIONS
CONTENTS
0 Introduction
1 Scope and field of application
2 References
3 Definitions
3.1 Reference model definitions
3.2 Terms defined in other Recommendations
3.3 Conformance testing definitions
3.4 Basic terms
3.5 Types of testing
3.6 Terminology of test suites
3.7 Terminology of results
3.8 Terminology of test methods
4 Abbreviations
5 The meaning of conformance in OSI
5.1 Introduction
5.2 Conformance requirements
5.3 Static conformance requirements
5.4 Protocol implementation conformance statement (PICS)
5.5 Dynamic conformance requirements
5.6 A conforming system
5.7 Interworking and conformance
6 Conformance and testing
6.1 Objectives of conformance testing
6.1.1 Introduction
6.1.2 Basic interconnection tests
6.1.3 Capability tests
6.2 Protocol implementation extra information for testing (PIXIT)
6.3 Conformance assessment process outline
6.4 Analysis of results
6.4.1 General
6.4.2 Repeatability of results
6.4.3 Comparability of results
6.4.4 Auditability of results
7 Test methods
7.1 Introduction
7.2 Classification of real open systems and IUTs for conformance testing
7.2.1 Classification of systems under test
7.2.2 Identification of the implementation under test (IUT)
7.3 Abstract testing methodology - General
7.4 Abstract testing functions
7.5 Overview of abstract test methods
7.5.1 End-system IUTs
7.5.2 The local test methods
7.5.3 External test methods
7.5.4 Variants of end-system test methods
7.5.5 Relay-system IUTs
7.6 Applicability of test methods to real open systems
7.7 Applicability of the test methods to OSI* protocols and layers
8 Test suites
8.1 Structure
8.2 Generic, abstract and executable test cases
9 Relationships between concepts and roles
10 Compliance
0 Introduction
1 Scope and field of application
2 References
3 Definitions
4 Abbreviations
5 Compliance
6 Conformance requirements in OSI* Recommendations*
6.1 Introduction
6.2 General requirements
6.3 Conformance sections
6.4 Additional guidance for new protocol Recommendations*
7 PICS proformas
7.1 Requirements on PICS proformas
7.2 Guidance on PICS proformas
8 Test suite production process
9 Determining the conformance requirements and PICS
9.1 Introduction
9.2 Conformance requirements
9.3 PICS proforma
10 Test suite structure
10.1 Basic requirements
10.2 The test group structure
10.3 Test purposes
11 Generic test case specification
11.1 Introduction
11.2 Description of generic test cases
11.3 Relation of generic to abstract test cases
12 Abstract test methods
12.1 Introduction
12.2 General specification of the abstract test methods
12.3 Single-layer test methods for single-layer IUTs in end-systems
12.4 Multi-layer test methods for multi-layer IUTs (LM, DM, CM, RM)
12.5 Single-layer testing of multi-layer IUTs or SUTs (Embedded methods)
12.6 Relay test methods
12.7 Choice of test method
12.7.1 Introduction
12.7.2 IUT environments
12.7.3 Applicability of the abstract test methods
12.7.4 Illustrative examples
12.8 Test coordination procedures
13 Specification of abstract test suites
13.1 Test cases
13.2 Test suites
14 Use of an abstract test suite specification
15 Test suite maintenance
ANNEX A – Options
Options
ANNEX B – Guidance for protocol Recommendations* writers
ANNEX C – Incomplete static conformance requirements
ANNEX D – The tree and tabular combined notation
APPENDIX I – Applicability of the test methods to OSI* protocols
APPENDIX II – Index of definitions of terms
APPENDIX III – Examples for guidance for PICS proforma specifiers
III.1 Abbreviations
III.2 PDU example
III.3 Parameter example
III.4 Supported services example
APPENDIX IV – Example of choice of abstract test methods
IV.1 Rationale for the transport layer
IV.2 Main test methods to be used for the transport layer