1
Scope
2 References
3 Definitions
4 Abbreviations and acronyms
5 Functional block diagram
6 Interfaces
6.1 Optical interfaces
6.2 Electrical interfaces
6.3 External reference
clock input
6.4 Input interface sensitivity
7 Jitter generation function
7.1 Modulation source
7.2 Clock generator
7.3 Digital test pattern
generator
7.4 Minimum jitter
generation capability
7.5 Generation accuracy
8 Jitter measurement function
8.1 Reference timing
signal
8.2 Measurement
capabilities
8.3 Measurement bandwidths
8.4 Measurement accuracy
8.5 Analogue output
8.6 Jitter transfer
measurement accuracy
9 Operating environment
Annex A – OTUk test signals for jitter measurement
A.1 Introduction
A.2 Test signal structure
for OTN signals