CONTENTS

 1     Scope 
 2     References 
        2.1     Normative references         
        2.2     Informative references        
 3     Definitions  
 4     Abbreviations   
 5     Conventions     
 6     Functional block diagram 
 7     Interfaces   
        7.1     Optical interfaces   
        7.2     Electrical interfaces
        7.3     External reference clock input        
        7.4     Input interface sensitivity    
 8     Jitter/wander generation function  
        8.1     Modulation source 
        8.2     Clock generator     
        8.3     Digital test pattern generator           
        8.4     Pointer sequence generator
        8.5     Minimum jitter/wander generation capability           
        8.6     Generation accuracy          
 9     Jitter measurement function          
        9.1     Reference timing signal       
        9.2     Measurement capabilities   
        9.3     Measurement bandwidths  
        9.4     Measurement accuracy      
        9.5     Jitter transfer measurement accuracy          
        9.6     Additional facilities 
10     Wander measurement function    
       10.1     Reference timing signal      
       10.2     Measurement of TIE (Time Interval Error) 
       10.3     Measurement of transient TIE (Time Interval Error)           
       10.4     Measurement of MTIE (Maximum Time Interval Error)     
       10.5     Measurement of TDEV (Time Deviation)  
       10.6     Measurement of frequency offset   
       10.7     Measurement of frequency drift rate          
11     TDEV wander noise generation function  
12     MTIE wander noise generation function   
13     Operating environment    
Annex A–Structured test signals for the measurement of jitter    
        A.1     Introduction          
        A.2     Test signal structure for STM‑N signals     
        A.3     Test signal structure for concatenated STM‑N signals        
Annex B–Definition of band-limited peak-to-peak phase slope error    
Annex C–MTIE upper limit for TDEV wander noise    
Appendix I–Guidelines concerning the measurement of jitter in SDH systems    
Appendix II–Guidelines concerning the measurement of wander in SDH systems    
       II.1     Wander measurements       
       II.2     Clock stability measurements          
Appendix III–Guidelines concerning the generation of pointer test sequences    
Appendix IV–Total jitter measurement function response    
       IV.1     Introduction          
       IV.2     Measurement filter parameters      
       IV.3     Mask limits for high-pass measurement filter response        
Appendix V–Verification of MTIE and TDEV calculation algorithms    
        V.1     TIE noise source functional description      
        V.2     First example of TIE noise generator         
        V.3     Second example of TIE noise generator     
Appendix VI–MTIE generation evaluation    
Appendix VII–Method for verification of measurement result accuracy and intrinsic fixed error    
      VII.1     Verification description and application     
      VII.2     System implementation     
      VII.3     Results and interpretation  
Appendix VIII–Method for characterization of transmit intrinsic jitter    
     VIII.1     Verification description and application     
     VIII.2     Method 
     VIII.3     Diagnostic test pattern      
     VIII.4     Calculation of peak-to-peak value from the probability distribution function