CONTENTS

 1     Scope
 2     References
        2.1     Normative references
        2.2     Informative references
 3     Definitions
 4     Abbreviations
 5     Conventions
 6     Functional block diagram
 7     Interfaces
        7.1     Optical interfaces
        7.2     Electrical interfaces
        7.3     External reference clock input
        7.4     Input interface sensitivity
 8     Jitter/wander generation function
        8.1     Modulation source
        8.2     Clock generator
                  8.2.1     Accuracy of the clock generator
        8.3     Digital test pattern generator
                  8.3.1     Digital test patterns
                  8.3.2     Digital test patterns for SDH tributary signals
        8.4     Pointer sequence generator
                  8.4.1     Pointer test sequence generation capability
        8.5     Minimum jitter/wander generation capability
        8.6     Generation accuracy
                  8.6.1     Phase amplitude error
                  8.6.2     Phase slope error
                  8.6.3     Intrinsic jitter/wander of generation function
 9     Jitter measurement function
        9.1     Reference timing signal
        9.2     Measurement capabilities
                  9.2.1     Measurement range
                  9.2.2     Selectable threshold
                  9.2.3     Measurement of RMS jitter
                  9.2.4     Input phase tolerance for SDH tributary signals
        9.3     Measurement bandwidths
                  9.3.1     Frequency response of jitter measurement function for SDH line signals
                  9.3.2     Frequency response of jitter measurement function for SDH tributary signals
        9.4     Measurement accuracy
                  9.4.1     Measurement result accuracy
                  9.4.2     Fixed error of SDH line jitter measurements
                  9.4.3     Fixed error of SDH tributary jitter measurements
                  9.4.4     Variable error of SDH tributary jitter measurements
                  9.4.5     Digital test signal-dependent error
        9.5     Additional facilities
                  9.5.1     Analogue output
10     Wander measurement function
       10.1     Reference timing signal
       10.2     Measurement of TIE (Time Interval Error)
                 10.2.1     Sampling interval
                 10.2.2     Measurement bandwidth
                 10.2.3     Measurement range
                 10.2.4     Measurement result accuracy
       10.3     Measurement of transient TIE (Time Interval Error)
                 10.3.1     Sampling Interval
                 10.3.2     Measurement Bandwidth
                 10.3.3     Measurement Range
                 10.3.4     Measurement Result Accuracy
       10.4     Measurement of MTIE (Maximum Time Interval Error)
                 10.4.1     Measurement and observation interval ranges
                 10.4.2     Calculation algorithm accuracy
                 10.4.3     Measurement result accuracy
       10.5     Measurement of TDEV (Time Deviation)
                 10.5.1     Measurement and observation interval ranges
                 10.5.2     Calculation algorithm accuracy
                 10.5.3     Measurement result accuracy
       10.6     Measurement of Frequency Offset
                 10.6.1     Measurement range
                 10.6.2     Calculation algorithm accuracy
                 10.6.3     Measurement result accuracy
       10.7     Measurement of Frequency Drift Rate
                 10.7.1     Measurement range
                 10.7.2     Calculation algorithm accuracy
                 10.7.3     Measurement result accuracy
11     TDEV wander noise generation function
12     Operating environment
Annex A - Structured test signals for the measurement of jitter
        A.1     Introduction
                  A.1.1     Payload test conditions
                  A.1.2     SDH overhead byte conditions
        A.2     Test signal structure for STM‑N signals
                  A.2.1     STM‑1 signal
                  A.2.2     STM‑N signal (N ³ 4)
                  A.2.3     STM‑0 signal
        A.3     Test signal structure for concatenated STM‑N signals
                  A.3.1     STM‑N signal (N ³ 4)
Annex B - Definition of band-limited peak-to-peak phase slope error
Annex C - Specification of distribution for TDEV wander noise generation
Appendix I - Guidelines concerning the measurement of jitter in SDH systems
Appendix II-Guidelines concerning the measurement of wander in SDH systems
       II.1     Wander measurements
                 II.1.1     General considerations on wander measurement configurations
                 II.1.2     Synchronized wander measurements
                 II.1.3     Non-synchronized wander measurements
       II.2     Clock stability measurements
Appendix III - Guidelines concerning the generation of pointer test sequences
Appendix IV - Total jitter measurement function response
       IV.1     Introduction
       IV.2     Measurement filter parameters
       IV.3     Mask limits for high-pass measurement filter response
                 IV.3.1     SDH tributary jitter measurement high-pass filter
Appendix V - Verification of MTIE and TDEV calculation algorithms
        V.1     TIE noise source functional description
        V.2     First example of TIE noise generator
        V.3     Second example of TIE noise generator