1 Scope
2
References
2.1 Normative references
2.2 Informative references
3
Definitions
4
Abbreviations
5
Conventions
6
Functional block diagram
7
Interfaces
7.1 Optical interfaces
7.2 Electrical interfaces
7.3 External reference clock input
7.4 Input interface sensitivity
8
Jitter/wander generation function
8.1 Modulation source
8.2 Clock generator
8.2.1
Accuracy of the clock generator
8.3 Digital test pattern generator
8.3.1 Digital test patterns
8.3.2 Digital test patterns for SDH tributary
signals
8.4 Pointer sequence generator
8.4.1 Pointer test sequence generation
capability
8.5 Minimum generation capability
8.5.1 Jitter/wander generation capability for
SDH line signals
8.5.2 Jitter/wander generation capability for
SDH tributary signals
8.6 Generation accuracy
8.6.1 Intrinsic jitter/wander of generation
function
9
Jitter measurement function
9.1 Reference timing signal
9.2 Measurement capabilities
9.2.1 Measurement range
9.2.2 Selectable threshold
9.2.3 Measurement of RMS jitter
9.2.4 Measurement capability for SDH tributary
signals
9.3 Measurement bandwidths
9.3.1 Frequency response of jitter measurement
function for SDH line signals
9.3.2 Frequency response of jitter measurement
function for SDH tributary signals
9.4 Measurement accuracy
9.4.1 Measurement result accuracy
9.4.2 Fixed error of SDH line jitter
measurements
9.4.3 Fixed error of SDH tributary jitter
measurements
9.4.4 Frequency response error
9.4.5 Digital test signal-dependent error
9.5 Additional facilities
9.5.1 Analogue output
10 Wander measurement function
10.1 Reference timing signal
10.2 Measurement of TIE (Time Interval Error)
10.2.1 Sampling interval
10.2.2 Measurement bandwidth
10.2.3 Measurement range
10.2.4 Measurement result accuracy
10.3 Measurement of MTIE (Maximum Time Interval Error)
10.3.1 Measurement and observation interval
ranges
10.3.2 Calculation algorithm accuracy
10.3.3 Measurement result accuracy
10.4 Measurement of TDEV (Time Deviation)
10.4.1 Measurement and observation interval
ranges
10.4.2 Calculation algorithm accuracy
10.4.3 Measurement result accuracy
11 Operating environment
Annex A – Structured test signals for the measurement of jitter
A.1 Introduction
A.1.1 Payload test conditions
A.1.2 SDH overhead byte conditions
A.2 Test signal structure for STM‑N signals
A.2.1
STM‑1 signal
A.2.2 STM‑N signal (N ³ 4)
A.2.3 STM‑0 signal
A.3 Test signal structure for concatenated STM‑N signals
A.3.1 STM‑N signal (N ³ 4)
Appendix I – Guidelines concerning the measurement of jitter in SDH systems
Appendix II – Guidelines concerning the measurement of wander in SDH systems
II.1 Wander measurements
II.1.1 General considerations on wander
measurement configurations
II.1.2
Synchronized wander measurements
II.1.3 Non-synchronized wander measurements
II.2 Clock stability measurements
Appendix III – Guidelines concerning the generation of pointer test sequences
Appendix IV – Total jitter measurement function response
IV.1 Introduction
IV.2 Measurement filter parameters
IV.3 Mask limits for high-pass measurement filter response
IV.3.1 SDH tributary jitter measurement high-pass
filter
Appendix V – Verification of MTIE and TDEV calculation algorithms
V.1 TIE noise source functional description