1 Scope
2
References
2.1 Normative references
2.2 Bibliographical references
3
Definitions
4
Abbreviations
5
Block diagram
6
Interfaces
6.1 Electrical interfaces
6.2 Interface impedances
7
Test signal source
7.1 Modulation source
7.2 Clock generator
7.2.1 Accuracy of the clock generator
7.3 Test sequence generator
7.3.1 Test sequences
7.3.2 Generation errors
8
Jitter measuring circuit
8.1 Input sensitivity of the electrical interfaces
8.2 Jitter measurement ranges
8.2.1 Measurement of peak-to-peak jitter
8.2.2 Selectable
threshold
8.2.3 Measurement of r.m.s. jitter
8.3 Measurement bandwidths
8.3.1 Frequency response of jitter measuring
circuit and filters
8.4 Measurement accuracy
8.4.1 General
8.4.2 Fixed error
8.4.3 Error at other frequencies
8.4.4 Test sequence dependent error
8.4.5 Pulse shape at the measurement access
point
8.5 Additional facilities
8.5.1 Analogue output
8.5.2 Reference timing signal
9
Operating environment
Appendix I – Guidelines concerning the measurement of jitter
I.1 Definitions and causes of jitter
I.2 Test environment
I.2.1 Controlled test sequences
I.2.2 Bit rate
I.2.3 Pulse shape and cable characteristics
I.2.4 Secondary test environment parameters
I.3 Glossary of test configuration functional block components
I.4 Jitter tolerance measurement
I.4.1 Actual tolerance
I.4.2 Jitter tolerance template compliance
I.5 Jitter transfer
characteristic measurement
I.5.1 Linear processes
I.6 Output jitter measurement
I.6.1 Live traffic
I.6.2 Controlled test sequences
Appendix II – Guidelines concerning the measurement of wander
II.1 Wander measurements
II.1.1 Wander measurement configurations –
General considerations
II.1.2 Synchronized wander measurements
II.1.3 Non-synchronized wander measurements
II.2 Clock stability measurements
II.3 Quantities to be measured
II.3.1 Time deviation
II.3.2 Maximum time interval error
II.3.3 Allan deviation
II.4 External reference