1 Scope
2 References
3 Definitions
3.1 Terms defined elsewhere
3.2 Terms defined in this Recommendation
4 Abbreviations, acronyms and symbols
5 Storage conditions
6 Electrical requirements
6.1 resistance,
R
6.2 hold
current, Ih
6.3 trip
current, It
6.4 time-to-trip,
ttrip
6.5 resistance
1 h after tripping, R1 for polymer PTC thermistors
6.6 reset voltage, Vreset for ECL
̀6.7 impulse resistance, Rimp for ceramic PTC
thermistors
6.8 Impulse
voltage withstand
6.9 AC
power fault
6.10 Impulse
endurance test (life test)
6.11 AC endurance test (PTC thermistor) (life test)
7 Test methods
7.1 resistance,
R
7.2 hold current, Ih
7.3 trip current, It
7.4 time-to-trip, ttrip
7.5 resistance
1 h after tripping, R1, for polymer PTC thermistor
7.6 reset voltage, Vreset for ECL
7.7 impulse
resistance, Rimp at Vimp
for ceramic PTC thermistors
7.8 Impulse voltage withstand
7.9 AC
power fault tests
7.10 Impulse
endurance test (life test)
7.11 AC
endurance test (life test)
8 Environment tests
8.1 Robustness of terminations
8.2 Solderability
8.3 Resistance to soldering heat
8.4 Vibration
8.5 Bump
8.6 Rapid changes of temperature
8.7 Climatic sequence
8.8 Damp heat, steady state
8.9 Fire hazard
8.10 Solvent resistance of marking
8.11 Component solvent resistance
9 Informative characteristics
9.1 Hold current variation with temperature
9.2 Trip-time variation with fault current value for PTC thermistor
OCPs
9.3 Resistance recovery after a trip event for PPTC thermistor OCPs
10 Identification
10.1 Marking
10.2 Documentation
11 Ordering information
Bibliography