1 Scope
2 References
3 Definitions
4 Abbreviations and acronyms
5 Storage conditions
6 Electrical requirements
6.1 Varistor voltage
6.2 Maximum a.c. (d.c.) continuous operating voltage
6.3 Leakage current d.c.
6.4 Leakage current a.c.
6.5 Capacitance
6.6 Clamping voltage
6.7 Maximum discharge current
6.8 ESD impulse test
6.9 Rated dissipation (impulse life)
6.10 Rated impulse energy
6.11 Impulse durability
6.12 Endurance at maximum operating temperature
6.13 TOV withstanding capability
6.14 Insulation resistance (for insulated MOV only)
6.15 Voltage proof (for insulated MOV only)
7 Test methods
7.1 Varistor voltage
7.2 Maximum continuous a.c. (d.c.) voltage
7.3 Leakage current d.c.
7.4 Leakage current a.c.
7.5 Capacitance
7.6 Clamping voltage
7.7 Maximum discharge current
7.8 ESD impulse test (for SMD type MOV only)
7.9 Rated dissipation (impulse life)
7.10 Rated impulse energy
7.11 Impulse durability
7.12 Endurance at maximum operating temperature
7.13 TOV withstanding
7.14 Insulation resistance
7.15 Voltage proof
8 Environment tests
8.1 Robustness of terminations
8.2 Solderability
8.3 Resistance to soldering heat
8.4 Vibration
8.5 Bump
8.6 Rapid changes of temperature
8.7 Climatic sequence
8.8 Damp heat, steady state
8.9 Fire hazard
8.10 Solvent resistance of marking
8.11 Component solvent resistance
9 Informative characteristics
9.1 V-I characteristic
9.2 Current peak de-rating curve
9.3 Volt-ampere characteristics of low field region
10 Identification
10.1 Marking
10.2 Documentation
11 Ordering information
Annex A – Impulses used in this Recommendation
A.1 Definition of T1/T2 impulse
A.2 Tolerances for T1/T2
impulse (Figures A.1 and A.2)
A.3 Tolerances for rectangular impulse (Figure A.3)
A.4 ESD discharge current impulse (Figure A.4)
Appendix I – Mounting method for measurement of SMD type
I.1 Recommended mounting method
I.2 Wave soldering method
I.3 Reflow soldering method
Appendix II – Response of MOV to 8/20 impulse current and clamping voltage
test
II.1 Double peaks on the voltage waveform
II.2 Instantaneous volt-ampere characteristic
II.3 Voltage limiting characteristics
II.4 Methods for avoiding interference during clamping voltage
measurement
Bibliography