Rec. ITU-T G.8251 (11/2018) - The control of jitter and wander within the optical transport network (OTN)
Summary
History
FOREWORD
Table of Contents
Introduction
1 Scope
2 References
3 Definitions
4 Abbreviations and acronyms
5 Conventions
6 Network limits for the maximum output jitter and wander at an OTUk interface
     6.1 Network limits for jitter
     6.2 Network limits for wander
7 Jitter and wander tolerance of network interfaces
     7.1 Jitter and wander tolerance of OTN interfaces
          7.1.1 OTU1 jitter and wander tolerance
          7.1.2 OTU2 jitter and wander tolerance
          7.1.3 OTU3 jitter and wander tolerance
          7.1.4 OTU4 jitter and wander tolerance
     7.2 Jitter and wander tolerance of client interfaces
Annex A  Specification of the ODUk clock (ODC)
     A.1 Scope
     A.2 Applications
     A.3 Frequency accuracy
     A.4 Pull-in and pull-out ranges
          A.4.1 Pull-in range
          A.4.2 Pull-out range
     A.5 Noise generation
          A.5.1 Jitter generation
               A.5.1.1 ODCa, ODCb and ODCr jitter generation
               A.5.1.2  ODCp jitter generation
          A.5.2 Wander generation
     A.6 Noise tolerance
     A.7 Jitter transfer
          A.7.1 Jitter transfer for ODCb
          A.7.2 Jitter transfer for ODCr
          A.7.3 Jitter transfer for ODCp
     A.8 Transient response
Appendix I  Relationship between network interface jitter requirements and input jitter tolerance
     I.1 Network interface jitter requirements
     I.2 Input jitter tolerance of network equipment
Appendix II  Effect of OTN on the distribution of synchronization via STM-N and synchronous Ethernet clients
     II.1 Introduction
     II.2 Provisional synchronization reference chain
     II.3 Synchronization network limit
     II.4 Variable channel memory
     II.5 Maximum buffer hysteresis
Appendix III  Hypothetical reference model (HRM) for 3R regenerator jitter accumulation
Appendix IV  3R regenerator jitter accumulation analyses
     IV.1 Introduction
     IV.2 Model 1
          IV.2.1 Model details
          IV.2.2 Model results
               IV.2.2.1 Results for cases based on SDH regenerator bandwidths [ITU-T G.783]
               IV.2.2.2 Results for cases based on OTN 3R regenerator bandwidths (in this Recommendation): High-band jitter for OTU1, OTU2 and OTU3; Wideband jitter for OTU1 and OTU2
               IV.2.2.3 Results for cases based on OTN 3R regenerator bandwidths (in this Recommendation): Wideband jitter for OTU3
     IV.3 Model 2
          IV.3.1 Introduction
          IV.3.2 Structure of the equivalent building blocks in the noise simulation
     IV.4 Jitter generation of regenerators using parallel serial conversion
Appendix V  Additional background on demapper (ODCp) phase error and demapper wideband jitter generation requirements
     V.1 Introduction
     V.2 Demapper phase error
     V.3 Demapper wideband jitter generation due to gaps produced by fixed overhead in OTUk frame
Appendix VI  OTN atomic functions
     VI.1 Introduction
Appendix VII  Hypothetical reference models (HRMs) for CBRx (SDH and synchronous Ethernet client) and ODUj payload jitter and short-term wander accumulation
     VII.1 Introduction
     VII.2 OTN hypothetical reference models
     VII.3 Impact of the insertion of OTN islands in the ITU-T G.803 synchronization reference chain
Appendix VIII  CBRx and ODUj payload jitter and short-term wander accumulation analyses
     VIII.1 Introduction
     VIII.2 Simulation model
          VIII.2.1 First-order, high-pass jitter measurement filter
          VIII.2.2 Second-order, low-pass filter with gain peaking and 20 dB/decade roll-off
          VIII.2.3 Mapper/multiplexer model
          VIII.2.4 Overall model
     VIII.3 Jitter and short-term wander simulation results
          VIII.3.1 Results for wideband jitter accumulation
               VIII.3.1.1  CBR2G5 client wideband jitter accumulation results
               VIII.3.1.2  ODU1 client wideband jitter accumulation results
               VIII.3.1.3  STM-16 client short-term wander (TDEV) accumulation results
               VIII.3.1.4  Conclusions
Bibliography